MEASUREMENT OF PROPERTIES OF THIN FILMS ON CHROMIUM BY THE REFLECTION OF POLARIZED LIGHT
- 1 July 1951
- journal article
- Published by Wiley in Annals of the New York Academy of Sciences
- Vol. 53 (5) , 1064-1081
- https://doi.org/10.1111/j.1749-6632.1951.tb48882.x
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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