Error considerations in cylindrical near-field scan using the modulated scattering technique
- 23 March 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 25, 170-173
- https://doi.org/10.1109/aps.1987.1150091
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Far-field accuracy investigation using modulated scattering technique for fast near-field measurementsIEEE Transactions on Antennas and Propagation, 1985