Possible Occurrence of DNA Double-strand Breaks during Repair of U.V.-induced Damage in Yeast
- 1 January 1987
- journal article
- research article
- Published by Taylor & Francis in International Journal of Radiation Biology
- Vol. 52 (1) , 107-113
- https://doi.org/10.1080/09553008714551531
Abstract
The yeast mutant rad54-3, which is temperature conditional for dsb rejoining, is sensitive to u.v. light when held at the restrictive temperature following exposure. We propose that this is attributable to the enzymatic formation of dsb in DNA containing u.v. lesions and a subsequent lack of dsb repair in this mutant.This publication has 25 references indexed in Scilit:
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