Quantitative Texture Measurements on Evaporated Films
- 1 November 1965
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 36 (11) , 3686-3687
- https://doi.org/10.1063/1.1703069
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Structure and Annealing Behavior of Metal Films Deposited on Substrates near 80 °K. II. Gold Films on GlassJournal of Vacuum Science and Technology, 1965
- Quantitative Determination of Preferred OrientationJournal of Applied Physics, 1964
- Method for Obtaining Complete Quantitative Pole Figures for Flat Sheets Using One Sample and One Sample HolderJournal of Applied Physics, 1955
- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949
- Preferred Orientation Determination Using a Geiger Counter X-Ray Diffraction GoniometerJournal of Applied Physics, 1948