Technique for characterization of thin film porosity
- 1 November 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 332 (1-2) , 257-261
- https://doi.org/10.1016/s0040-6090(98)01264-4
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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