A model of aging of dielectric extruded cables
- 13 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 347-351
- https://doi.org/10.1109/icsd.1989.69218
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Study on Improvements to the Dielectric Breakdown Strength of Extruded Dielectric CablesIEEE Transactions on Power Apparatus and Systems, 1985
- A General Approach to the Endurance of Electrical Insulation under Temperature and VoltageIEEE Transactions on Electrical Insulation, 1981