Reliability analysis in the presence of chance common cause shock failures
- 1 January 1991
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 31 (1) , 15-19
- https://doi.org/10.1016/0026-2714(91)90339-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The Binomial Failure Rate Common Cause ModelTechnometrics, 1986