X-ray-absorption fine-structure measurement of single-crystal materials

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Abstract
We are reporting a successful measurement and analysis of x-ray-absorption fine-structure data of a single-crystal material using the electron-detection method. The measurements were made by taking spectra at slightly different sample orientations, and the spectra were later patched to remove the effect of Bragg reflections. The results are in good agreement with each other and with polycrystalline data. It can be applied to many single-crystal materials, and a similar method can also be used with other detection methods.