The Current Dependency of Crystal Unit Resistance at Low Drive Level

• 1 January 1971
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 139-147
• https://doi.org/10.1109/freq.1971.199848

Abstract

Keywords

• ELECTRICAL RESISTANCE MEASUREMENT
• RESONANT FREQUENCY
• POLLUTION MEASUREMENT
• OSCILLATORS
• ELECTRODES
• MEASUREMENT UNITS
• ACTIVE CIRCUITS
• CIRCUIT TESTING
• NOISE LEVEL
• CURRENT MEASUREMENT