Structures and electronic transport on silicon surfaces
- 1 March 1999
- journal article
- review article
- Published by Elsevier in Progress in Surface Science
- Vol. 60 (5-8) , 89-257
- https://doi.org/10.1016/s0079-6816(99)00008-8
Abstract
No abstract availableKeywords
This publication has 149 references indexed in Scilit:
- Surface conductivity for Au or Ag on Si(111)Physical Review B, 1996
- Reexamination of the Ag/Si(111)-√3 × √3 surface by scanning tunneling microscopyPhysical Review B, 1992
- Theoretical calculations of the scanning-tunneling-microscopy images of the Si(111)√3 × √3 -Ag surfacePhysical Review B, 1991
- Correlation between surface core levels and surface states in Si(111)-(7×7) probed by Ag adsorptionPhysical Review B, 1990
- STM studies of nucleation and the initial stages of film growthCritical Reviews in Solid State and Materials Sciences, 1990
- I n s i t u conductivity and Hall measurements of ultrathin nickel silicide layers on silicon(111)Journal of Applied Physics, 1989
- Electronic conductivity of Si(111)-7×7Physical Review B, 1986
- Inelastic scattering of slow electrons from Si(111) surfacesPhysical Review B, 1984
- On the relationship between the critical exponents of percolation conductivity and static exponents of percolationJournal of Physics A: General Physics, 1984
- Free‐radical decay in irradiated PMMAJournal of Polymer Science: Polymer Physics Edition, 1974