Consideration of age degradation in the RF performance of CMOS radio chips for high volume manufacturing

This publication has 2 references indexed in Scilit:

• On the degradation of p-MOSFETs in analog and RF circuits under inhomogeneous negative bias temperature stress
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• RF circuit performance degradation due to soft breakdown and hot-carrier effect in deep-submicrometer CMOS technology
  IEEE Transactions on Microwave Theory and Techniques, 2001