Application of the Quantum Hall Effect in Metrology
- 1 January 1985
- journal article
- Published by IOP Publishing in Metrologia
- Vol. 21 (1) , 11-18
- https://doi.org/10.1088/0026-1394/21/1/004
Abstract
No abstract availableKeywords
This publication has 31 references indexed in Scilit:
- Some remarks on the present understanding of the quantized hall effect in two dimensionsPublished by Springer Nature ,2008
- The Gauge Argument for Accurate Quantization of the Hall ConductancePublished by Springer Nature ,1984
- High-Precision Test of the Universality of the Josephson Voltage-Frequency RelationPhysical Review Letters, 1983
- Precision determination of h/e2 and the fine-structure constant from magneto-transport measurements on 2D electronic systemsLecture Notes in Physics, 1983
- Measurement of the Fine-Structure Constant by Means of the Quantized Hall ResistanceMetrologia, 1983
- Determination of the Fine-Structure Constant Using GaAs-HeterostructuresPhysical Review Letters, 1982
- Quantized Hall Resistivity in Si-MOSFETs Measured at Liq. 3He TemperaturesJournal of the Physics Society Japan, 1982
- Localization in a Strong Magnetic FieldPublished by Springer Nature ,1982
- The finite-structure constant α A contribution of semiconductor physics to the determination of αPublished by Springer Nature ,1981
- New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall ResistancePhysical Review Letters, 1980