Crystallization behavior of sputter-deposited amorphous Ge2Sb2Te5 thin films
- 15 July 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 86 (2) , 774-778
- https://doi.org/10.1063/1.370803
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Rapid-phase transitions of GeTe-Sb2Te3 pseudobinary amorphous thin films for an optical disk memoryJournal of Applied Physics, 1991
- Reaction Kinetics in Differential Thermal AnalysisAnalytical Chemistry, 1957