High-frequency surface-displacement detection using an STM as a mixer-demodulator
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 388-392
- https://doi.org/10.1016/0304-3991(92)90297-w
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Calibration of scanning tunneling microscope transducers using optical beam deflectionApplied Physics Letters, 1989
- Optical Detection of UltrasoundIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 1986
- Electric Tunnel Effect between Dissimilar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963
- Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963