Chemical characterization of coatings by analytical techniques sensitive to the surface and near-surface
- 1 August 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 53 (1) , 3-18
- https://doi.org/10.1016/0040-6090(78)90364-4
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- The analysis of solid surfaces by low energy ion scattering spectroscopyJournal of Colloid and Interface Science, 1976
- Surface and thin film compositional analysis. Description and comparison of techniquesAnalytical Chemistry, 1975
- Surface and thin film analysisAnalytical Chemistry, 1975
- Surface analysis using proton beamsThin Solid Films, 1973
- Comparison of surface layer analysis techniquesThin Solid Films, 1973
- Relaxation effects on auger energiesChemical Physics Letters, 1972
- Instrument Response Functions for Potential Modulation DifferentiationReview of Scientific Instruments, 1972
- Ion Microprobe Mass AnalyzerScience, 1972
- Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de GraaffNuclear Instruments and Methods, 1971
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968