Some aspects of stacking fault contrast in thick crystals at high accelerating voltages
- 16 August 1972
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 12 (2) , 549-556
- https://doi.org/10.1002/pssa.2210120225
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Maximizing the penetration in high voltage electron microscopyPhilosophical Magazine, 1971
- Bloch wave notation in many-beam electron diffraction theoryActa Crystallographica Section A, 1971
- A comparison of the diffraction conditions for obtaining optimum fringe contrast in bright and dark field images of stacking faultsPhysica Status Solidi (a), 1970
- Aspects of Bloch-Wave Channeling in High-Voltage Electron MicroscopyJournal of Applied Physics, 1970
- Enhancement of Thickness Fringe Contrast in Thick Crystals at Low Accelerating VoltagesPhysica Status Solidi (b), 1970
- Systematic Reflections in Transmission Electron DiffractionPhysica Status Solidi (b), 1969
- Some electron diffraction contrast effects at planar defects in crystalsPhilosophical Magazine, 1967
- Electron Microscopic Images of Single and Intersecting Stacking Faults in Thick Foils. Part I: Single FaultsPhysica Status Solidi (b), 1963
- Anomalous electron absorption effects in metal foilsPhilosophical Magazine, 1960