Investigation of monolayers by secondary ion mass spectroscopy (SIMS)

Publisher Website

31 July 1979

journal article
Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics

Vol. 31 (1-2) , 151-160
https://doi.org/10.1016/0020-7381(79)80114-x

Abstract

No abstract available

Keywords

This publication has 6 references indexed in Scilit:

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Developments in secondary ion mass spectroscopy and applications to surface studies
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