An integrated threshold gate

• 1 January 1967
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• Vol. X, 114-115
• https://doi.org/10.1109/isscc.1967.1154549

Abstract

Keywords

• RESISTORS
• SWITCHES
• LABORATORIES
• LOGIC DESIGN
• NOISE LEVEL
• PACKAGING
• CIRCUIT NOISE
• INTEGRATED CIRCUIT SYNTHESIS
• AGING