Letter to the Editor: New values for silicon reference materials, certified for isotope abundance ratios
Open Access
- 9 July 2012
- journal article
- Published by National Institute of Standards and Technology (NIST) in Journal of Research of the National Institute of Standards and Technology
- Vol. 99 (2) , 201-202
- https://doi.org/10.6028/jres.099.016
Abstract
New isotope abundance and relative atomic mass (atomic weight) values - with low, hitherto unattained uncertainty - are reported for two previously described silicon reference materials using a well-known method with an improved isotope-ratio mass spectrometer. These new values are directly traceable to the SI, more specifically to the unit for amount of substance, the mole, and independent of the SI unit of mass and of the Avogadro constant. Besides the residual mass-spectrometric uncertainties, these new values depend in effect only on a recently published direct comparison of the cyclotron frequency in a Penning trap of 28Si+ with that of 12C+.Keywords
This publication has 2 references indexed in Scilit:
- Letter to the editor - Silicon reference materials certified for isotope abundancesJournal of Research of the National Institute of Standards and Technology, 1991
- Absolute isotopic abundance ratios and the atomic weight of a reference sample of siliconJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1975