Progress in multilayer devices as X‐ray optical elements
- 1 June 1985
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 138 (3) , 267-277
- https://doi.org/10.1111/j.1365-2818.1985.tb02620.x
Abstract
SUMMARY: A new kind of mirror based on multilayering techniques gives the possibility of preparing artificial Bragg reflectors over all the X‐UV range. The possibility to choose most of the parameters governing the reflectivity opens the possibility to get a very good efficiency, even under normal incidence. Main parameters, evaporating techniques and tests are described. Some example of recent results are compared to the theoretical predictions.Keywords
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