Automated orientation analysis of back-reflection X-ray Laue patterns. A system for indexing Laue spots and outputting stereographic projections by microcomputer.
Open Access
- 1 January 1985
- journal article
- Published by Society of Materials Science, Japan in Journal of the Society of Materials Science, Japan
- Vol. 34 (384) , 1105-1109
- https://doi.org/10.2472/jsms.34.1105
Abstract
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