Real-time study of migration in aluminum films by means of subÅngström-sensitive scattering and profiling methods
- 20 March 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 198 (1-2) , 149-156
- https://doi.org/10.1016/0040-6090(91)90333-s
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Contact Damage in Single‐Crystalline Silicon Investigated by Cross‐Sectional Transmission Electron MicroscopyJournal of the American Ceramic Society, 1988
- Stylus profiling instrument for measuring statistical properties of smooth optical surfacesApplied Optics, 1981
- Scattering Characteristics Of Optical MaterialsOptical Engineering, 1978