Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes
- 1 October 1996
- journal article
- research article
- Published by Elsevier in Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis
- Vol. 357 (1-2) , 191-197
- https://doi.org/10.1016/0027-5107(96)00101-7
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Culture, Sports, Science and Technology
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