Ion Bombardment of Silicon
- 1 April 1963
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 34 (4) , 827-830
- https://doi.org/10.1063/1.1729546
Abstract
When silicon plates were bombarded with protons of energies about 100 kV, the infrared absorption spectrum above 1.1 μ showed chromatic fringes corresponding approximately to the range of the protons. The fringes did not begin to disappear on annealing until the plates were heated to over 1100°C. The effect appears to be caused by a reflecting layer involving trapped hydrogen. After long irradiation, small flatbottomed pits were found of about the depth of the range. The effect could also be produced with helium ions on silicon. No effect was found with germanium.This publication has 5 references indexed in Scilit:
- Diffusion of Deuterium in Deuteron-Irradiated CopperJournal of Applied Physics, 1960
- Radiation Effects of Bombardment of Quartz and Vitreous Silica by 7.5-kev to 59-kev Positive IonsPhysical Review B, 1960
- Neutron and Fission Fragment Damage in ZirconiaPhysical Review Letters, 1959
- Damage to Silicon Produced by Bombardment with Helium IonsJournal of Applied Physics, 1957
- On the disordering of solids by action of fast massive particlesDiscussions of the Faraday Society, 1949