Measurement of the piezoelectric field across strained InGaN/GaN layers by electron holography
- 2 July 1999
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 111 (5) , 281-285
- https://doi.org/10.1016/s0038-1098(99)00130-1
Abstract
No abstract availableKeywords
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