Angle-resolved photoelectron spectroscopy of the valence orbitals of SiCl4 as a function of photon energy from 14 to 80 eV

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Abstract
Angle‐resolved photoelectron spectroscopy coupled with synchrotron radiation have been used to measure partial cross sections and angular distribution parameters, β, from a photon energy of 14 to 80 eV for SiCl4. Parallel to these measurements, calculations have been made using the continuum multiple scattering Xα method. The results have been examined, primarily in terms of the phenomena of the Cooper minimum and shape resonances. Minima in both the cross sections and β values were found for each of the first five orbitals of SiCl4: 2t1, 8t2, 2e, 7t2, and 7a1. These minima were examined for their energy positions and, in the case of the β values, the depth of the minimum. Shape resonances were calculated in the photoionization of each of the orbitals, and a number of experimental features due to shape resonances are identified. The results, both experimental and theoretical, are compared with earlier work on CC14.