Field and Hall effects in semiconducting
- 1 July 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 46 (1) , 520-523
- https://doi.org/10.1103/physrevb.46.520
Abstract
The field-effect mobility, Hall coefficient, and conductivity as functions of the oxygen concentration and temperature are reported for films on the insulating side of the insulator-to-metal transition. The temperature dependence of the conductivity and Hall coefficient indicate that for small δ the excess oxygen introduces acceptor states at about 30 meV above the valence-band edge. The field effect reveals a space-charge layer in which carriers are depleted at the air- interface. The size of the field effect is limited by localized states at the interface.
Keywords
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