HRTEM investigation of the 90° domain structure and ferroelectric properties of multi-layered PZT thin films
- 1 April 2003
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 66 (1-4) , 708-712
- https://doi.org/10.1016/s0167-9317(02)00988-7
Abstract
No abstract availableKeywords
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