High-resolution electron energy loss spectroscopy evidence for electron beam-induced decomposition of trimethylsilane adsorbed on Si(100)
- 1 October 1998
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 136 (1-2) , 159-165
- https://doi.org/10.1016/s0169-4332(98)00338-9
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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