All-solid-state microscope-based system for picosecond time-resolved photoluminescence measurements on II-VI semiconductors
- 1 May 1992
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (5) , 2994-2998
- https://doi.org/10.1063/1.1142598
Abstract
No abstract availableKeywords
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