Recrystallization of vacuum-deposited ultrathin CdS films by the H2S heat-treatment process

Abstract
Recrystallization of vacuum‐deposited ultrathin CdS films activated with Ag on a glass substrate is studied by the H2S flow heat‐treatment process at 300 °C. Observation of the recrystallized films under a polarizing microscope reveals void formation and distinct hexagonal uniaxial crystals at the edge of the voids: The x‐ray diffraction pattern shows a sharp peak at the (002) axis. It is found that the combined action of the Ag activator and the H2S flow heat‐treatment process has a tendency of lowering the recrystallization temperature in these films.