Launcher and microstrip characterization

Abstract
A method for identifying scattering parameters of launchers and uniform microstrips is presented. It is shown that 8 complex measurements (magnitude and phase) on two microstrips which are different only in length, inserted between two launchers, can give, with suitable algebraic treatment, the S-parameters of either the microstrips and the launchers. This technique is promising for deembedding active devices as well for microstrip discontinuities.