Small Magnetic Field Mapping Probes of Thin Semiconducting Films
- 1 September 1959
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 30 (9) , 815-817
- https://doi.org/10.1063/1.1716761
Abstract
The Hall effect in thin semiconducting films has been employed to produce a magnetic field mapping probe of very small active area. Germanium probes having active areas of approximately 10 square microns were found to have a sensitivity of approximately 100 oe. Results obtained on thin InSb films indicate small area probes of this material should be sensitive to fields smaller than five oersteds.Keywords
This publication has 2 references indexed in Scilit:
- A New Method for Precision Measurement of the Hall and Magneto-Resistive CoefficientsReview of Scientific Instruments, 1951
- A Magnetic Field Strength Meter Employing the Hall Effect in GermaniumReview of Scientific Instruments, 1948