Understanding thin film X-ray spectra
- 1 November 1984
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 136 (2) , 179-191
- https://doi.org/10.1111/j.1365-2818.1984.tb00527.x
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- X-ray production in thin films by electrons with energies between 40 and 100 keV. 1—Bremsstrahlung cross-sectionsX-Ray Spectrometry, 1983
- X‐ray production in thin films by electrons with energies between 40 and 100 keV. 2—Characteristic cross‐sections and the overall x‐ray spectrumX-Ray Spectrometry, 1983
- Kβ/Kα ratios in energy‐dispersive x‐ray emission analysisX-Ray Spectrometry, 1980
- Relative transition probabilities for the x-ray lines from the K levelJournal of Applied Physics, 1979
- An evaluation of K-shell fluorescence yields; observation of outer-shell effectsJournal of Physics B: Atomic and Molecular Physics, 1979
- Principles of Thin Film X-Ray MicroanalysisPublished by Springer Nature ,1979
- Inner Shell lonization by Relativistic Electron ImpactJapanese Journal of Applied Physics, 1978
- Inelastic Collisions of Fast Charged Particles with Atoms and Molecules—The Bethe Theory RevisitedReviews of Modern Physics, 1971
- Bremsstrahlung Cross-Section Formulas and Related DataReviews of Modern Physics, 1959
- Theoretical Continuous X-Ray Energy and PolarizationPhysical Review B, 1945