Image restoration in sets of noisy electron micrographs
- 25 June 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
The imaging process in a transmission electron microscope (TEM) produces a number of artifacts including the contrast transfer function (CTF) and envelope functions. In addition, when electron cryomicroscopy is performed for purposes of single particle reconstruction, signal to noise ratios are very low, generally peaking between 0.1 and 1.0, and averaging 0.01 to 0.1. We apply a semi-empirical model of the microscope artifacts to optimally correct data used for 3D single particle reconstructions.Keywords
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