Noise measurements on the floating diffusion input for charge-coupled devices
- 1 December 1974
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 45 (12) , 5303-5306
- https://doi.org/10.1063/1.1663234
Abstract
A technique is presented for electrically introducing charge into a charge-coupled device (CCD) in a stable uniform low-noise manner. The technique utilizes a floating diffusion whose capacitance (Cfd) can be tailored for particular applications or monitored directly for noise measurements. Experimental results are presented which demonstrate that charge can be introduced into a CCD with a variance of kTCfd. This technique is particularly germaine to the introduction of a ``fat zero'' into a low-light-level surface channel CCD imager.This publication has 4 references indexed in Scilit:
- Characterization of surface channel CCD image arrays at low light levelsIEEE Journal of Solid-State Circuits, 1974
- Use of charge-coupled devices for delaying analog signalsIEEE Journal of Solid-State Circuits, 1973
- The quantitative effects of interface states on the performance of charge-coupled devicesIEEE Transactions on Electron Devices, 1973
- Noise suppression in charge transfer devicesProceedings of the IEEE, 1972