Properties of high-,Si: An extrapolation
- 1 November 1979
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 20 (9) , 3647-3652
- https://doi.org/10.1103/physrevb.20.3647
Abstract
We have measured the low-temperature specific heats of two samples of Nb-Si prepared by chemical vapor deposition. From the specific-heat data, low-, Nb-Si is found to have a of 15.2 ± 1.5 mJ/mole and a Debye temperature, , of 319 ± 10 K, for a mole containing four atoms. In addition, the low-temperature specific heat of arc-melted ( structure) has been measured. The was found to be 15.2 ± 1.0 mJ/mole and was 345 ± 10 K. Using these data, the properties of stoichiometric (high-) Si are extrapolated from the substoichiometric Nb-Si samples measured, by analogy to the Nb-Ge system. Stoichiometric, single-phase Si, if preparable, should have a of 30 mJ/mole and a of 275 K. By calculating , the electron-phonon coupling constant, and treating as a variable (15-30 K), the electronic density of states, , is extracted from this extrapolated and is found to be low, varying from 1.38 states/ (eV atom) at states/ (eV atom) at K. The calculated for the low- is 1.01 states/ (eV atom) and is remarkably close to the 1.08 states/ (eV atom) calculated for the high- Ge.
Keywords
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