Low-temperature growth of ZnSe by molecular beam epitaxy using cracked selenium
- 26 February 1990
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 56 (9) , 845-847
- https://doi.org/10.1063/1.102680
Abstract
The growth of zinc selenide by molecular beam epitaxy using a cracked selenium source is studied. It is found that high quality growth can be achieved at substantially lower substrate temperatures than has been possible using uncracked selenium sources. It is determined from reflection high-energy electron diffraction observations that the use of cracked selenium produces growth dominated by a two-dimensional mechanism at substrate temperatures as low as 225 °C and that exposure of the GaAs substrate to cracked selenium prior to the initiation of growth has a substantial effect on the GaAs substrate and the early stages of ZnSe growth.Keywords
This publication has 11 references indexed in Scilit:
- Band bendings, band offsets, and interface instabilities in-GaAs/-ZnSe heterojunctionsPhysical Review B, 1989
- Optical transitions in ultra-high-purity zinc selenidePhysical Review B, 1989
- Incorporation processes in MBE growth of ZnSeJournal of Crystal Growth, 1989
- Electronic Transport Properties of ZnSe Layers on GaAsMRS Proceedings, 1989
- Optical vibrational modes of ZnSe-strained-layer superlatticesPhysical Review B, 1988
- ZnSe/GaAs Heterointerface Stabilization by High-Temperature Se Treatment of GaAs SurfaceJapanese Journal of Applied Physics, 1988
- Optical characterization and band offsets in ZnSe- strained-layer superlatticesPhysical Review B, 1988
- ZnSe– and Se–GaAs interfacesJournal of Vacuum Science & Technology A, 1985
- High-quality ZnSe thin films grown by molecular beam epitaxyApplied Physics Letters, 1983
- Molecular beam epitaxy of zinc chalcogenidesJournal of Crystal Growth, 1981