Effect of microstructural changes on thermally activated flux-creep behavior in the Bi-Sr-Ca-Cu-O system

1 May 1990

journal article
research article
Published by American Physical Society (APS) in Physical Review B

Vol. 41 (13) , 8833-8837
https://doi.org/10.1103/physrevb.41.8833

Abstract

We measured magnetic relaxation for the zero-field-cooled magnetization of liquid-quenched Bi-Sr-Ca-Cu-O samples with various microstructures at an applied field of 1 kOe. We found that a large amount of crystal defects observed in the sample matrix greatly increase the pinning strength and, in turn, enhance the flux-creep behavior. The relaxation rate peaks at 14 K and drops to zero near 60 K. The increased activation energy in our crystallized samples is attributed to strong pinning caused by a high density of precipitates and lattice stacking faults.

Keywords

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