Microprobe profiling of fluorine and other trace elements to large depths in teeth
- 1 April 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 3 (1-3) , 648-650
- https://doi.org/10.1016/0168-583x(84)90455-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- PIXE analysis of caries related trace elements in tooth enamelNuclear Instruments and Methods, 1981
- Applications of PIXE to studies in dental and mental healthsNuclear Instruments and Methods, 1981
- Proton microprobe determination of fluorine depth distributions and surface multielement characterization in dental enamelJournal of Radioanalytical and Nuclear Chemistry, 1980
- Microanalysis of Flourine by nuclear reactionsNuclear Instruments and Methods, 1980
- Proton-induced X-ray emission in the trace analysis of human tooth enamel and dentineThe International Journal of Applied Radiation and Isotopes, 1976