UHV Cantilever Beam Technique for Quantitative Measurements of Magnetization, Magnetostriction, and Intrinsic Stress of Ultrathin Magnetic Films

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Abstract
A new method—based on the cantilever beam principle—is presented, by means of which quantitative values of the magnetization, magnetostriction, and intrinsic stress of magnetic thin films can be determined. Moreover investigations of magnetic anisotropies and Curie temperature are possible. The high sensitivity achievable enables measurements even on films approaching monolayer thickness. The method is fully compatible with UHV and—via the intrinsic stress—additionally provides important information on growth mode and microstructure of the films under investigation. First results on polycrystalline Fe films demonstrate impressively the performance of the technique.

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