Model-based, multiple-fault diagnosis of dynamic, continuous physical devices
- 1 December 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Expert
- Vol. 6 (6) , 38-43
- https://doi.org/10.1109/64.108950
Abstract
A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter's algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.Keywords
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