A Simplified Instrument Failure Detection Scheme
- 1 July 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Aerospace and Electronic Systems
- Vol. AES-14 (4) , 558-563
- https://doi.org/10.1109/taes.1978.308680
Abstract
A simplified version of the dedicated observer scheme for detecting incipient instrument failures in automatic systems is presented. This scheme requires only a single observer, driven by a single instrument. Simple logical combinations of estimated instrument outputs from the observer with the actual instrument outputs allow small faults in all the instruments to be detected. Tests on a simulation of a practical system indicate the scheme is robust with respect to a small uncertainty in a dynamic parameter of the controlled plant.Keywords
This publication has 2 references indexed in Scilit:
- A Simplified Instrument Failure Detection SchemeIEEE Transactions on Aerospace and Electronic Systems, 1978
- Detecting Instrument Malfunctions in Control SystemsIEEE Transactions on Aerospace and Electronic Systems, 1975