A specimen temperature controller for field emission and field-ion microscopy
- 1 February 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (2) , 96-97
- https://doi.org/10.1088/0022-3735/9/2/010
Abstract
A temperature controller based on resistive heating for field emission and field-ion microscope specimens is described. The instrument makes use of recently available integrated circuits and allows simultaneous operation at EHT. The temperature can be preset to within +or-5% in the range 300-2300K and is attained in 1-5 s.Keywords
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