Absolute measurement of structure factors of Si by using X-ray Pendellösung and interferometry fringes
- 1 January 1972
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
- Vol. 28 (1) , 69-80
- https://doi.org/10.1107/s0567739472000154