Submicrometer x-ray beam production by a thin film waveguide

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Abstract
A hard x‐ray waveguide capable of reducing a 13 keV monochromatic beam in one direction from 30 to only 0.1 μm has been characterized with synchrotron radiation. The guiding structure consisted of a carbon layer sandwiched between two Ni layers sputter‐deposited onto float glass. A beam exiting at the end of the guide in guiding direction was observed when a resonance effect due to the formation of x‐ray standing waves in the total reflection region takes place. The measured beam divergence (1.3 mrad) agrees with expectations. The total efficiency (exiting photon flux/incident photon flux) can ideally exceed 10−2 but is only 10−4 for this first prototype.