Temperature Coefficients of the Work Functions of the (110) and (100) Surfaces of Tungsten Single Crystals and of Polycrystalline Tungsten Foil

Abstract
A modification of the Kelvin contact potential difference technique has been used to measure the temperature coefficient of the work function of three tungsten surfaces over the temperature range from 77°–1300°K. Two of the surfaces were polished and etched single‐crystal planes having the (110) and (100) orientations, the third was a sample of polycrystalline foil. The results obtained were foil(11±1)×10−5eV/K(110)(6.3±0.6)×10−5eV/K(100)(9.1±0.4)×10−5eV/K and these are in qualitative agreement with predictions based on the temperature dependence of the electron smoothing component of the surface double layer.