Intensity and Linewidth of Rayleigh Scattering near the Double Plait Point of the System Ne-Kr

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Abstract
From the intensity and Rayleigh linewidth of light scattered by the system Ne-Kr near the temperature minimum of the critical line (double plait point), we have verified the phenomenological rule that, for constant overall composition, the critical exponents are independent of the path of approach to the critical line, except along a path which is asymptotically parallel to the critical line where they assume twice their usual values.