Comments on "A Bayes sensitivity analysis when using the beta distribution as a prior

1 April 1990

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability

Vol. 39 (1) , 6-8
https://doi.org/10.1109/24.52635

Abstract

The commenter makes several critical comments concerning the above-named work of B.S. Duran and J.M. Booker (see ibid., vol.37, p.239-47, June 1988). Duran and Booker present a detailed reply, pointing out, among other things, that the commenter is assuming a much more well-defined problem than theirs.

Keywords

SENSITIVITY ANALYSIS
RELIABILITY
PROBABILITY DISTRIBUTION
ROUNDOFF ERRORS
TESTING

This publication has 2 references indexed in Scilit:

A Bayes sensitivity analysis when using the beta distribution as a prior
IEEE Transactions on Reliability, 1988
The Use of Incomplete Beta Functions for Prior Distributions in Binomial Sampling
Technometrics, 1965