Metallic Contact on GaAs Microwave Devices

• 1 April 1977
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• No. 07350791,p. 232-239
• https://doi.org/10.1109/irps.1977.362798

Abstract

Keywords

• GALLIUM ARSENIDE
• MICROWAVE DEVICES
• VARACTORS
• GOLD
• OHMIC CONTACTS
• GUNN DEVICES
• SPUTTER ETCHING
• LIFE TESTING
• DEGRADATION
• DIODES